Semiconductor testing — US PTAB Patent Cases
3 decisions indexed
Page 1 of 1 · 3 total
FormFactor, Inc. v.Technoprobe S.p.A.
FormFactor and Technoprobe have settled their IPR dispute over a probe‑card patent. They jointly request that the settlement agreement be treated as confidential business information, effectively terminating the proceeding.
FormFactor, Inc. v.Technoprobe S.p.A.
FormFactor challenges Technoprobe's '885 patent via an IPR, asserting that the claims are anticipated and obvious over prior art references. The petitioner relies heavily on reference Kim, combined with Schmid, Fan, Bross, and a 2016 SWTest Presentation to invalidate multiple claims related to probe card design.
FormFactor, Inc. v.Technoprobe S.p.A.
FormFactor challenges Technoprobe's wafer probing patent (11035885) before the PTAB, arguing anticipation and obviousness. The Board found a reasonable likelihood of prevailing on multiple grounds, instituting the IPR proceeding.
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